Norimitsu Ichikawa, Kota Usuki and Fumiya Hatanaka
Electronic device may malfunction owing to electrostatically induced voltages. Malfunctions or failures can occur
because of induced voltages in the range of 10 V. Charged human bodies can occasionally reach as high as 10 kV
in offices. When such an object moves near the metal housing of electronic device, a high induced voltage can
occasionally be generated in the case. In experiments, the induced voltages in two metal cases are measured using
two spark gaps and two electromagnetic wave sensors when the charged object moves away from the metal case
and passes by another case. The results will be helpful in the consideration of preventive measures for electronic
device.
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