Journal of Electrical & Electronic Systems

Dhanushya T

Publications

• Research Article
  Error Correction For Soft Errors
  Author(s): Dhanushya T and Latha TDhanushya T and Latha T
  
  Radiation induced soft errors are susceptible to most of the electronic products with the development of CMOS technology. A particle striking on any of the electronic products can produce soft errors that can be either single event upset or single event transient. There are various techniques such as FERST, BISER, TMR, DMR, DICE, SEC-DED, DEC-TED, EDAC, PARSHIELD, and STEM for soft error elimination. But these techniques do not provide self-checking capability, and has high area, output corruption. Soft Error and Timing error Tolerant Flip Flop (SETTOFF) is used to conquer these drawbacks. The self-checking is provided at the transition detection part. SETTOFF is designed for normal operation and fault operation. This has higher area overhead than BISER. So BISER by means of self-checking capability has been proposed to conquer the limitations by reducing the area. BISER by means of s.. Read More»
  DOI: 10.4172/2332-0796.1000276

  Abstract PDF