Journal of Lasers, Optics & Photonics

Frost RL

Publications

• Research Article
  XRD, TEM, EPR, IR and Nonlinear Optical Studies of Yellow Ochre
  Author(s): Lakshmi Reddy S, Udayabashakar Reddy G, Ravindra Reddy T, Anitta R Thomas, RamaSubba Reddy R, Frost RL and Tamio EndoLakshmi Reddy S, Udayabashakar Reddy G, Ravindra Reddy T, Anitta R Thomas, RamaSubba Reddy R, Frost RL and Tamio Endo
  
  Yellow ochre mineral obtained from Vempalli mandal, Cuddapah district, Andhra Pradesh of India is investigated in the present work. Its chemical analysis indicate that Fe2O3=4.22 wt% and TiO2=0.64 wt%. Structural characterization is performed using X-ray diffraction (XRD). XRD results suggest that goethite (Fe2O3) and quartz are present. Among them goethite is the major constituent. Its unit cell is orthorhombic with a=4.14, b=10.0, c=3.03Å. The ligands around the metal ion present in the structure are investigated using FTIR spectroscopy. Internal structure studied using TEM suggests that the mineral consists of needle shaped iron oxide nano particles and quartz formed as tetrahedral and octahedral layers. EPR results indicate that the unit cell of the crystal contains Fe(III), and its g values are found to be 4.19 and 2.13. FTIR properties are due to the presence of silicate a.. Read More»
  DOI: 10.4172/2469-410X.1000120

  Abstract PDF