Department of Physics, Huazhong University of Science and Technology, Wuhan 430074, China
Commentary
Nanoscopic Insights into Radiobiological Damage: Fragmentation by Secondary Low-energy Electrons
Author(s): Nemico Denim*
DOI:
10.37421/2332-0796.2024.13.117
Journal of Electrical & Electronic Systems received 733 citations as per Google Scholar report
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