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Revealing the Unseen Applications of Electron Microscopy in Science
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Fluid Mechanics: Open Access

ISSN: 2476-2296

Open Access

Brief Report - (2024) Volume 11, Issue 4

Revealing the Unseen Applications of Electron Microscopy in Science

Ugur Yao*
*Correspondence: Ugur Yao, Department of Basic Oncology, Oncology Institute, Istanbul University, 34093 Istanbul, Turkey, Email:
Department of Basic Oncology, Oncology Institute, Istanbul University, 34093 Istanbul, Turkey

Received: 01-Aug-2024, Manuscript No. fmoa-24-152302; Editor assigned: 03-Aug-2024, Pre QC No. P-152302; Reviewed: 15-Aug-2024, QC No. Q-152302; Revised: 21-Aug-2024, Manuscript No. R-152302; Published: 28-Aug-2024 , DOI: 10.37421/2476-2296.2024.11.337
Citation: Yao, Ugur. “Revealing the Unseen Applications of Electron Microscopy in Science.” Fluid Mech Open Acc 11 (2024): 337.
Copyright: © 2024 Yao U. This is an open-access article distributed under the terms of the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited.

Introduction

Electron Microscopy (EM) has revolutionized the field of materials science, biology, and nanotechnology by enabling the visualization of structures at the atomic and molecular levels. Since its invention in the 1930s, EM has evolved into various modalities, including transmission electron microscopy, scanning electron microscopy and more recently, cryo-electron microscopy. Each of these techniques offers unique advantages and is instrumental in uncovering the unseen aspects of matter. This review article aims to provide an overview of the principles of electron microscopy, explore its diverse applications across various scientific disciplines, and discuss the future prospects of this powerful imaging technique. Electron microscopy operates on the principle of using electrons instead of photons to illuminate a sample. Electrons have much shorter wavelengths than visible light, allowing for higher resolution imaging. The typical resolution of a standard optical microscope is limited to about 200 nanometers, whereas EM can achieve resolutions on the order of a few picometers. Transmission Electron Microscopy involves transmitting electrons through a very thin sample. The electrons interact with the specimen, creating an image that reflects the internal structure. TEM is particularly useful for observing fine details such as crystal structure, defects, and internal morphology. Scanning Electron Microscopy a focused beam of electrons scans the surface of a sample, generating secondary electrons that are collected to form an image. SEM provides three-dimensional information about the surface topography and composition of materials [1-3].

Description

Cryo-Electron Microscopy Cryo-EM has gained prominence in the biological sciences, allowing researchers to visualize biological macromolecules in their native states. Samples are rapidly frozen to preserve their structure, which is particularly important for observing proteins and other complex molecules that may be sensitive to traditional staining techniques. Modern electron microscopes are equipped with advanced detectors and software that enhance their capabilities. Innovations such as electron energy loss spectroscopy and energy-dispersive X-ray spectroscopy allow for detailed compositional analysis, making EM not just a tool for imaging but also for material characterization. The rise of nanotechnology has necessitated advanced characterization techniques. Electron microscopy is indispensable for analyzing nanomaterials, such as carbon nanotubes, graphene, and nanoparticles. TEM and SEM provide critical insights into the size, shape, and crystallography of these materials, which are essential for their applications in electronics, energy storage, and drug delivery. EM is pivotal in identifying defects within crystalline materials. Understanding defects such as vacancies, interstitials, and dislocations is crucial for tailoring the properties of materials. Techniques like EDX in conjunction with SEM allow for detailed elemental mapping, aiding in resource exploration and environmental studies [4,5].

Conclusion

The semiconductor industry relies heavily on electron microscopy for failure analysis and quality control. As devices shrink in size, the need for high-resolution imaging to detect defects at the nanoscale becomes increasingly important. EM helps identify issues such as contamination, pattern fidelity, and layer thickness, ensuring the reliability of semiconductor products. In forensic science, EM provides critical information that can aid in criminal investigations. For instance, SEM can be used to analyze trace evidence such as gunshot residue, fibers, and paint chips. The high-resolution imaging capabilities of EM enable forensic scientists to establish links between evidence and suspects, enhancing the overall investigative process. Electron microscopy plays a vital role in environmental science, particularly in studying particulate matter and pollutants. By examining the morphology and composition of aerosols, researchers can gain insights into air quality and its impact on human health. Additionally, EM is used to investigate the microstructure of sediments and soils, helping to understand biogeochemical cycles. Electron microscopy has proven to be an invaluable tool across various scientific disciplines, providing insights that were previously unattainable.

Acknowledgement

None.

Conflict of Interest

None.

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