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The use of X-ray analysis to identify optimum micro-strain to improve the ionic conductivity of CsAg2-2xTixI3(x=0-0.4)
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Journal of Material Sciences & Engineering

ISSN: 2169-0022

Open Access

The use of X-ray analysis to identify optimum micro-strain to improve the ionic conductivity of CsAg2-2xTixI3(x=0-0.4)


2nd International Conference and Exhibition on Materials Science & Engineering

October 07-09, 2013 Hampton Inn Tropicana, Las Vegas, NV, USA

Samir Osman Mohammed

Accepted Abstracts: J Material Sci

Abstract :

The superionic conductor materials often have rather special structure in that there are open tunnels or layers through which the mobile ions can move. AgI is the most prominent superionic conductor which has the highest ionic conductivity in its α-phase that is stable above 420 K. This paper is a part of our investigations on the effect of silver ion substitution by cations of different size on microstructure and ionic conductivity of the compound CsAg 2 I 3 . This attempt is to find out the suitable structure in order to improve the ionic mobility. Here, the divalent cation Ti+2is selected to replace silver ion in this compound. The X-ray diffraction data of the samples have been analyzed using Willamson-Hall method. The peaks of X-ray profile have been determined with more accuracy using PeakFit program. The results say that the lattice strain increases with increasing of Ti +2 cationcontents. As well as, the ionic conductivity enhances due to the increase in the lattice strain. Unit cell parameters have been also refined and obtained using Chekcell software.

Biography :

Samir Osman Mohammed has completed his Ph.D. at the age of 37 years from Mysore University. He is the head of curriculum committee in applied physics program, a member of International Center of Powder Diffraction. He has published several papers in reputed journals and serving as faculty member of physics department at Ibb University, Yemen.

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